000 01417nam a22003133 4500
001 u20363
003 SIRSI
090 _a187153
_9187152
100 _a04032013f m y0frey50 ba
200 1 _aEtude et caracterisation des phenomène de saturation et des courants parasites dans les transitors NMOS submicroniques application à la téchnologie"high-k"
_b[Thèse]/
_fAMHOUCHE YOUSSEF
205 _a1ERE EDITION
210 _cFD,
_d2005
215 _a137p.
345 _bFD454
606 1 _aPhysique
675 _aTH/53.08/AMH
700 1 _aAMHOUCHE,
_bYOUSSEF
901 _dDoctorat
949 _aTH/53.08/AMH
_i007016153
_mFSJESM
_lSTACKS
_o.STAFF. FD454
_tTHESE
_xBIB
949 _aTH/53.08/AMH
_i007016157
_mFSJESM
_lSTACKS
_o.STAFF. FD458
_tTHESE
_xBIB
949 _aTH/53.08/AMH
_i007016156
_mFSJESM
_lSTACKS
_o.STAFF. FD457
_tTHESE
_xBIB
949 _aTH/53.08/AMH
_i007016154
_mFSJESM
_lSTACKS
_o.STAFF. FD455
_tTHESE
_xBIB
949 _aTH/53.08/AMH
_i007016155
_mFSJESM
_lSTACKS
_o.STAFF. FD456
_tTHESE
_xBIB
596 _a2
999 _wUDC
_c1
_lSTACKS
_mFSJESM
_rY
_sY
_tTHESE
_u10/23/2013
_xBIB
_o.STAFF. FD454
999 _wUDC
_c2
_lSTACKS
_mFSJESM
_rY
_sY
_tTHESE
_u10/23/2013
_xBIB
_o.STAFF. FD458
999 _wUDC
_c3
_lSTACKS
_mFSJESM
_rY
_sY
_tTHESE
_u10/23/2013
_xBIB
_o.STAFF. FD457
999 _wUDC
_c4
_lSTACKS
_mFSJESM
_rY
_sY
_tTHESE
_u10/23/2013
_xBIB
_o.STAFF. FD455
999 _wUDC
_c5
_lSTACKS
_mFSJESM
_rY
_sY
_tTHESE
_u10/23/2013
_xBIB
_o.STAFF. FD456