000 00565nam a22001693 4500
001 u93991
003 SIRSI
090 _a218742
_9218741
100 _a frey50 ba
200 _fWASEDA.Y
_aNovel Application of Anomalous (Resonance) x-Ray Scattering for Structural Characterezation of Diosordered Materials/
_bLIVR
210 _cSPRINGER
345 _b6711
675 _aM204 LNP
700 1 _aWASEDA.Y
949 _aM204 LNP
_i003013918
_mFSTM
_lSTACKS
_o.STAFF. 6711
_tLIVR
_xBR
596 _a4
999 _wUDC
_c1
_lSTACKS
_mFSTM
_rY
_sY
_tLIVR
_u10/23/2013
_xBR
_o.STAFF. 6711